NORTEL-OPTICAL-PM-MIB

Description: Manages 15-minute and 24-hour performance monitoring counters for Nortel optical transport interfaces.

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NORTEL-OPTICAL-PM-MIB is a Nortel MIB for performance monitoring (PM) on optical transport network interfaces, providing standardized 15-minute and 24-hour PM bins common in SONET/SDH and DWDM management. It exposes a "recent" PM table capturing per-interface, per-monitor-type performance values along with their descriptive labels and measurement units, plus current and previous 15-minute interval values with validity flags and timestamps. This MIB is heavily used for performance and fault monitoring: by tracking current and previous PM interval values and their validity, operators can detect optical-layer degradation trends even when the underlying counter type is abstracted through generic monitor-type descriptors. It follows standard telecom PM conventions (aligned with ITU-T/Telcordia optical performance monitoring practices) though implemented as a Nortel-proprietary MIB. It is typically deployed in carrier optical transport networks (SONET/SDH/DWDM) where 15-minute and 24-hour PM data is essential for SLA reporting and proactive fault detection. Engineers can download the NORTEL-OPTICAL-PM-MIB file directly to load it into their MIB browser.

An administrator would poll nnOpticalPmRecentTable (via nnOpticalPmRecentEntry, indexed by nnOpticalPmRecentIfIndex and nnOpticalPmRecentMonType) to identify which performance parameter is being measured on a given optical interface, using nnOpticalPmRecentUnits and nnOpticalPmRecentMonTypeDescr for context. Comparing nnOpticalPmCurr15MinValue against nnOpticalPmPrev15MinValue, while checking nnOpticalPmCurr15MinValidity, reveals whether a metric like error seconds is trending upward within the current measurement window. The nnOpticalPmCurr15MinDateAndTime timestamp lets an operator correlate a PM anomaly with other network events occurring at the same time.

Optical performance monitoring for Nortel/Ciena equipment including signal quality, error rates, and facility metrics.