All MIBs › HUAWEI-COMMTEST-MIB › hwTestCommon
hwTestCommon
Module: HUAWEI-COMMTEST-MIB
OID (symbolic): HUAWEI-COMMTEST-MIB::hwTestCommon
OID (numeric): 1.3.6.1.4.1.2011.6.21.1
Node type: MODULE-IDENTITY
Description: This MIB is used for Metallic line test(MELT).Melt test is a common line status test method,used to test whether the copper twisted pair from the service board to the phone set is normal. Common MELT operations include starting a MELT test, querying the test result, querying the calibration data, and starting and stopping a searching tone test.
OID Breakdown
Upper-level ancestors (9 from the standard OID tree / other modules)
| Numeric OID | Name | Module |
|---|---|---|
| 1 | iso | LANART-AGENT |
| 1.3 | org | AirPair-MIB |
| 1.3.6 | dod | AirPair-MIB |
| 1.3.6.1 | internet | AirPair-MIB |
| 1.3.6.1.4 | private | AirPair-MIB |
| 1.3.6.1.4.1 | enterprises | AirPair-MIB |
| 1.3.6.1.4.1.2011 | huawei | HUAWEI-3COM-OID-MIB |
| 1.3.6.1.4.1.2011.6 | huaweiUtility | HUAWEI-3COM-OID-MIB |
| 1.3.6.1.4.1.2011.6.21 | hwTest | HUAWEI-BTEST-MIB |
| Numeric OID | Name | Module |
|---|---|---|
| 1.3.6.1.4.1.2011.6.21.1 | hwTestCommon | HUAWEI-COMMTEST-MIB |